Key Features
- Four independent, isolated input A/Ds
- Designed to read output signals from a completed Wheatstone bridge
- Used in applications requiring pressure, weight and stress transducers interface/measurement.
- On-chip digital filtering for wide dynamic range signal measurement
- DC excitation for load and accelerometer gauge interface (programmable from 2-12 VDC)
- Onboard management of A/D interface, register access and sample timing
- Internal and system calibration included
Automatic Background Built-In Test (BIT)/Diagnostic Capability
Automatic background BIT testing is provided. Each channel is checked at periodic intervals for correct A/D operation. Any failure triggers an interrupt if enabled, with the results available in the status registers. The testing is transparent to the user and has no effect on the operation of this module.
Platforms Supported
3U VPX (3 Modules) 6U VPX (6 Modules) 3U cPCI (3 Modules)
6U cPCI (6 Modules) VME (6 Modules) PCIe (3 Modules)