Key Features
NAI offers five smart function modules that convert these signals to a digital output corresponding to position in a variety of operating parameters. An LVDT/RVDT simulator is used to convert digital positional commands to corresponding AC signals.
Built-In Test (BIT)/Diagnostic Capability
The board supports three types of built-in tests: Power-On, Continuous Background and Initiated. The results of these tests are logically ORed together and stored in the BIT Dynamic Status and BIT Latched Status registers.
Power-On Self-Test (POST) / Power-on BIT (PBIT) / Start-up BIT(SBIT)
This board features a power-on self-test that will do an accuracy check of each channel and report the results in the BIT Status register when complete. After power-on, the Power-on BIT Complete register should be checked to ensure that POST/PBIT/SBIT test is complete before reading the BIT Latched Status.
Platforms Supported
3U VPX (3 Modules) 6U VPX (6 Modules) 3U cPCI (3 Modules)
6U cPCI (6 Modules) VME (6 Modules) PCIe (3 Modules)